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Sabrao Journal of Breeding and Genetics, Volume 48, Issue 1, 2016, pp. 72-79

Marker assisted selection for resistance to northern corn leaf blight in sweet corn

Abstract :

Marker assisted selection for resistance to Northern Corn Leaf Blight (NCLB), caused by Exserohilum turcicum, has been carried out for 3 years at Maejo University, Thailand. The objectives were to: (1) screen resistant (R) and susceptible (S) sweet corn inbreds for E. turcicum, (2) identify polymorphic SSR markers closely-linked to the known Ht genes for NCLB resistance, and use these polymorphic markers for selection of F2 progenies. One highly S line (NT58WS6#4) and 3 highly R lines (ChallengerS6-1, Sugar73S7-18 and hA4135) were identified and used for population development. Three SSR primers (umc1042, bnlg1721 and umc1149) showed polymorphism between susceptible and resistant lines. The 157 F2 plants were used to determine linkage between trait and markers. Only 2 SSR primers about 6.7 cM on chromosome 2; bnlg1721 and umc1042 were closely-linked to the resistant gene Ht1 (R2 = 0.2948 and 0.2626, respectively, P < 0.0001). These 2 SSR primers may be useful as molecular markers for NCLB resistance in sweet corn. © Society for the Advancement of Breeding Research in Asia and Oceania.

Keywords : Assisted selection,Northern corn leaf blight,Resistance,SSR marker,Sweet corn
Subject Area : Biotechnology Genetics Agronomy and Crop Science Animal Science and Zoology Horticulture

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